Experimental Comparisons of SiC JFETs and SiC MOSFETs in a PEBB based Converter

Abstract

Milestone 1: Device under test (DUT) selected. Gate-drive circuit designed for DUT.Milestone 2: Testbed designed and assembled. Both hardware and software are ready.Milestone 3: Experimental results of dc-dc mode, inverter/rectifier mode, reactive power flow mode are obtained.Milestone 4: Comparison matrix of DUT is provided with device recommendation for different operation mode.

Document Details

Document Type
DoD Grant Award
Publication Date
Nov 23, 2016
Source ID
N000141613191

Entities

People

  • Hui Li

Organizations

  • Florida State University
  • Office of Naval Research
  • United States Navy

Tags

Fields of Study

  • Engineering

Readers

  • Educational Psychology
  • Electrical Engineering
  • Integrated Circuit Design and Technology.