Enhanced instrumentation to understand software errors during EMI exposure to microcontrollers within and outside cavities
Abstract
As part of its present ongoing ONR Code 35 CDEW effort the University of New Mexico hasdemonstrated/is demonstrating two main physical phenomena:1. The statistical nature of electromagnetic fields inside complicated cascaded networks of chaoticcavities, and its agreement with the random coupling model (RCM) fused with the Baum-Liu-Tesche (BLT) electromagnetic topology.2. The dependent nature of the radiation impedance of active switching circuits (microcontrollers)on the instruction set being executed on the device.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Mar 03, 2017
- Source ID
- N000141712321
Entities
People
- Edl Schamiloglu
Organizations
- Office of Naval Research
- United States Navy
- University of New Mexico