Extended IR Mueller Matrix Measurement Capability
Abstract
The upgrade of the existing instrumentation to include the sources and optical elementsrequired for measurements at 1.152~m and 3.39~m, will allow the accurate characterization of theanti-reflective structures effects at the wavelengths of interest, and expand the training andeducation of several currently involved US graduate students.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- May 05, 2017
- Source ID
- N000141712358
Entities
People
- Ishwar Aggarwal
Organizations
- Office of Naval Research
- United States Navy
- University of North Carolina