UV to Deep IR material characterization
Abstract
The acquisition of the of the proposed broad-spectrum ellipsometer would greatly benefitthe $20M+ of research that Tufts University is performing yearly on DoD~s behest aswell as the DoD research being carried out by the other 140 colleges and universities inthe Boston area.The development of new materials is paramount in achieving the technological goals setout by the armed forces. Befor"e new materials can generate the new devices or improveexisting ones, however, they must be fully characterized and understood. At"" TuftsUniversity, we are exploring many new materials, both biological (e.g. silk and other biomedicalapplications) and inorganic"" (e.g. semiconductors, metals, semimetals, etc~). Tofully understand these materials and their potential to help achieve our desire""d futuretechnological capabilities, we need the right tools. Here, we propose the purchase of acustom-designed, dual-head, ultravi""olet to infrared ellipsometer. With the moneyrequested we will build this one of a kind instrument, which will serve as a model for""others to follow. The new devices created by these materials will be used for just aboutevery application imaginable, including po""wer, sensor, and medical. The acquisition ofthis system will not only enhance the research capabilities at Tufts, but those of the" 140colleges and universities in the Boston area as well. This system will facilitate the type oftransformative materials and device research needed for our armed forces to maintaintheir technological edge.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Jun 09, 2017
- Source ID
- N000141712591
Entities
People
- Thomas E. Vandervelde
Organizations
- Office of Naval Research
- Tufts University
- United States Navy