Acquisition of Scanning Acoustic Microscopy (SAM) and Decapsulator for WBG (GaN / SiC) Degradation Monitoring
Abstract
We propose to acquire, install and make available to all qualified users dedicated ScanningAcoustic Microscope (SAM) and Decapsulat"or. Using SAM and decapsulator in wide bandgapdevice (WBG) reliability analysis can dramatically accelerate our existing project sp"onsored byOffice of Naval Research (Award #: N00014-15-1-2325), and enable early warning tools for nextgeneration power electronic"s systems. They will also be used for ongoing industry projects to i)develop smart WBG gate drivers with early failure warning feature ii) monitor progressivestructural degradations for lifetime extension strategies. The equipment will be housed in the PowerElectronics Laboratory (PEL) at The University of Texas at Dallas (UTD) to complement theexisting degradation monitoring infrastructur"e. The proposed instrument will significantlystrengthen the research, education, and diversity goals of UT-Dallas.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Sep 29, 2017
- Source ID
- N000141712834
Entities
People
- Bilal Akin
Organizations
- Office of Naval Research
- United States Navy
- University of Texas at Dallas