Scanned probe and electrical characterization of one and two dimensional materials
Abstract
Title: Scanned probe and electrical characterization of one and two dimensional materialsObjective:To acquire a Scanned probe sta"tion for electrical characterization of one and two dimensional materials in support of ONR YIP award entitled, ""Electronics from On""e-dimensional Nanostructures of Two-Dimensional Materials"" (Award #: N00014-14-1-0501)Approach:PI will select vendors, purchase i"nstrumentation and carry out necessary testing and installation tasks as required. Statement of Work:PI will be responsible for" the entire process of researching, designing, acquiring and testing the instrumentation. Results obtained using the proposed instru"ment will significantly advance the research agenda described in the parent ONR grant.ONR Relevance:Requested instrumentation wil"l enhance PI s capability to carry out research funded by several DoD grants, including an ONR YIP award (N00014-14-1-0501).
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Sep 29, 2017
- Source ID
- N000141712967
Entities
People
- Abhay Pasupathy
Organizations
- Office of Naval Research
- Trustees of Columbia University in the City of New York
- United States Navy