Acquisition of an ion beam polishing and coating system for preparing cross-sections of materials for measurements of thermal conductivity by time-domain thermoreflectance
Abstract
We propose the purchase of an ion-beam polishing instrument at a cost of approximately $160k. The preparation of smooth surfaces is important for a wide variety of methods for analyzing materials; ion beam polishing is routinely used in sample preparation for electron microscopy. Here, the ion-beam polishing system will be used to prepare samples for non-contact laser-based measurements of the thermal conductivity of small crystals and other difficult-to-prepare samples. In ion-beam polishing, a high velocity stream of charged atoms is focused on a material’s surface. The flux of energetic ions continuously removes layers of atoms and produces a highly perfect mirror-like morphology, free from damage and imperfections that often plague samples prepared by conventional mechanical polishing using abrasive powders. The ion-beam polishing instrument will immediately improve the experiments of the PI on the thermal conductivity of small crystals of BAs (boron arsenide) and BP (boron phosphide) that are the subject of an Office of Naval Research Multidisciplinary University Research Initiative (MURI) on “Ultrahigh thermal conductivity materials”. The goal of the MURI is to advance the science underlying the management of heat generated by high power electronics. In the longerterm, the ion-beam polishing system will enable studies of the thermal conductivity of a wide variety of materials of interest in the management and conversion of thermal energy. Thermal management is a ubiquitous problem in commercial and defense engineering systems; advances in thermal management often lead directly to improved performance. The ion-beam polishing system will be maintained and operated by the central facilities of the Materials Research Laboratory at the University of Illinois at Urbana-Champaign. In addition to enabling measurements of thermal conductivity of complex materials, we anticipate extensive use of the ion-beam polishing system for the preparation of small inorganic crystals, polycrystalline metals and ceramics, polymers, and composite materials for analysis by electron microscopy and electron diffraction.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Jan 23, 2018
- Source ID
- N000141812086
Entities
People
- David Cahill
Organizations
- Office of Naval Research
- United States Navy
- University of Illinois Urbana–Champaign