Material Microstructure Characterization Instrumentation for Multi-Beam Adaptive Metallic Additive Manufacturing
Abstract
The Department of Electro-Optics and Photonics at the University of Dayton (UD) requests the acquisition of a scanning electron microscope (SEM) with an electron backscatter diffraction (EBSD) detector for microstructure analyses of materials processed with laser additive manufacturing (LAM). The instrumentation is needed to support the development of feedforward and feedback control strategies for the novel multi-beam LAM systems currently under development at UD. The new LAM systems allow for advanced adaptive spatio-temporal control of the laser power distribution (beam shaping) at the powder and thus effectively control of thermal gradients and liquid/solid interface velocity during the selective laser melting process. The SEM/EBSD instrumentation will provide the UD researchers and students the rapid material characterization feedback needed for tailoring the various parameters of the multi-beam laser source to achieve the demanded material properties. The requested instrument will be a cornerstone for establishing a new center for intelligent manufacturing of materials and multiscale devices with a focus on on-demand 3D printing of metals, insulators, and any type of thin film coatings that will help to modernize the manufacturing industry of the ~Rust Belt~ in the U.S. Midwest and Northeast.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Apr 25, 2019
- Source ID
- N000141912300
Entities
People
- Partha Banerjee
Organizations
- Office of Naval Research
- United States Navy
- University of Dayton