Instrumentation for Noise Characterization and Modeling of Semiconductor Devices
Abstract
The Department of Electrical and Computer Engineering at the University of California Santa Barbara requests funds to purchase equipment necessary for improved noise characterization and modeling of semiconductor devices, interfaces between semiconductors and insulators, and circuits. This instrumentation will address a gap in our capabilities regarding noisecharacterization. It will specifically be applied to Nitrogen-polar GaN devices and insulators, and it will be widely applicable to other material systems including but not limited to other ultra-wide bandgap semiconductors and 2D materials.The proposed system is composed of several components to provide device noise information over up to 12 decades of frequency bandwidth. An integrated low-frequency-noise instrument system will provide information regarding flicker, generation-recombination, and random telegraph noise of devices over a frequency range of 0.03 Hz to 10 MHz with software and hardware integration making this system readily usable to conduct measurements on a variety ofdevices. It is closely integrated with a shielded probe station to minimize external interference and interconnect parasitics in order to obtain excellent resolution and accuracy for on-wafer measurements. A precision low-noise bias supply allows these measurements to be conducted over swept bias. Software is included to validate and conduct these measurements. A low noisespectrum analyzer extends the frequency range to 50 GHz, covering RF and microwave frequencies at 50 ohm impedance. The spectrum analyzer will also leverage existing impedance tuners and software to measure vector noise parameters up to 10 GHz. Two additional tuners and associated probe station integration hardware are proposed as an option to add to the system togive full vector noise parameters up 50 GHz. This represents a substantial new capability for both current and new areas of research. The data, in conjunction with experiments and modeling, will give great insight into device performance, material properties, defects and traps, and circuit performance.This system is designed to have a broad and flexible range of capabilities to cover a wide variety of currently anticipated scenarios and also future research. Upgrades to hardware or software can be sought in the future to further advance capabilities. It will integrate well with existing facilities, complementing and extending upon the labs current capabilities. The system will beinstalled in a lab facility at UCSB which is available to additional academic and commercial users.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Jun 17, 2020
- Source ID
- N000142012660
Entities
People
- Umesh Mishra
Organizations
- Office of Naval Research
- United States Navy
- University of California, Santa Barbara