Utilizing Semiconductor Light Emission for Current Measurement, Temperature Measurement, and Reliability Assessment
Abstract
UC Santa Cruz (UCSC) has been working with the Naval Postgraduate School (NPS) on Novel semiconductor device research. Specifically, the researchinvolves measuring light emitted from the junction of a GaN diode and processing this information to obtain a measurement of the device on-state current and junction temperature. A joint patent application between UCSC and NPS has been submitted to cover this idea as well as the idea of determining a semiconductors reliability via light measurement. It has also become clear that foreign-based researchers have been working towards similar goals. This project proposes extended research in the data processing oflight so that the current measurement can be used for control of a medium-voltage power converter. This entails using advanced processing techniques to improve the current estimation speed so that the power converter switching frequency can be pushed towards 1 MHz. At the same time, medium-voltage will be applied. This will make this technique practical for programs such as the Navys iPEBB.Keywords: Power conversion, power semiconductor, control, reliability, signal processing.Approved for Public Release
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Apr 06, 2021
- Source ID
- N000142112260
Entities
People
- Keith Corzine
Organizations
- Office of Naval Research
- United States Navy
- University of California, Santa Cruz