3D Modeling and Simulation for Lifetime Prediction of an Electronic Component
Abstract
This project will develop a 3D model to predict the lifetime of a common electronic component. Experiments will be performed on a common electronic component (simple transistor) to determine functional-decline rate (“aging”) under specific environmental conditions. FEA/numerical methods will be used to simulate temperature-induced chemical aging on an electronic component. The results will be used to calculate an expected lifetime. The process of aging will be visualized in 3D. The objectives of this project are: a. To develop a 3D model predicting the lifetime of an electronic component b. To validate and supplement the model through experimentation c. To develop 3D visualization of th component aging process
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Aug 15, 2018
- Source ID
- N001641821006
Entities
People
- Chen Zhou
Organizations
- Naval Surface Warfare Center
- United States Navy
- University of Virginia