3-Dimensional Modeling, Simulation, and Visualization for Identifying Reliability and Aiding in Corrective Actions
Abstract
This project will develop a 3D model to predict the lifetime of a common electronic system. Experiments will be performed on common electronic components such as transistor, diode, capacitor, resistor, and inductor and a simple circuit system to determine functional-decline rate (“aging”) under specific environmental conditions. FEA/numerical methods will be used to simulate temperature, humidity, chemical-induced aging on an electronic component as well as a circuit system. Three-dimensional visualization of will be employed to allow an intuitive way to analyze the results. This project will leverage the previously funded project which developed a 3D model for predicting the effect of temperature on the aging of a transistor.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- May 19, 2020
- Source ID
- N001642011001
Entities
People
- Chen Zhou
Organizations
- Naval Surface Warfare Center
- United States Navy
- University of Virginia