Intermittent contact local dielectric spectroscopy
Abstract
The project is aimed at improving the resolving power of a special microscopy technique named Electrostatic Force Microscopy (EFM). Application of EFM can be beneficial to characterize the performance of innovative insulating materials. Current Navy needs of materials with high energy density, useful for the realization of batteries or electronic components with improved performances, require the development of new dielectric materials that can withstand extreme conditions of voltage. Such materials are often obtained by nanostructuring usual dielectrics, by forming multilayered structures or composites with the addition of nanoparticles of proper size and composition. Therefore, resolution down to the nanometer level is demanded to inspect the features of electric behavior of such materials, especially at the interface of such nanostructures. EFM is based on the more notorius Atomic Force Microscope (AFM), where a sharp tip is brought in contact with the surface of the sample, and like the stylus of a record player, it is sensitive to fine sample corrugations, with a resolution capable even to discriminate single atoms. If an electric voltage is applied to the tip, even electric charges can be detected on the same surface. However, if the stylus is pushed too hard on the surface, this could be damaged or charges could be swept away, therefore the AFM is operated in an “intermittent contact” mode, in which the tip periodically swings close and off the surface, thereby limiting surface damage and charge transfer. Still, such periodic impacts prevent a neat measurement of electric forces. In brief, the project is aimed at establishing the best operation conditions for this microscope to provide more reliable measurement of local electric properties of the surface.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Aug 20, 2019
- Source ID
- N629091912121
Entities
People
- Massimiliano Labardi
Organizations
- Consiglio Nazionale delle Ricerche
- Office of Naval Research
- United States Navy