V&V Capabilities and Standards for Trust

Abstract

This project improves microelectronics test and verification methodologies in support of verifying trust of untrusted parts and develops standards/practices to foster commercial development of secure and trusted parts. Verification and test technologies are required to provide direct program support for microelectronics trust verification when DoD Trusted Foundry Program options are not available. Core technical laboratories have recently been chartered as a Joint Federated Assurance Center (JFAC) to provide this support. Out-year demands will require an increase in capacity, which will take the form of additional personnel and/or equipment to permit scaling of assessment capabilities. Challenges have been identified, to include the ability to analyze leading-edge technologies, throughput/time required for analysis, ability to analyze third-party IP contained in microelectronic components, and analysis of non-application-specific integrated circuit (ASIC) components that are increasingly being used for agility, e.g., Field-Programmable Gate Arrays (FPGAs). This project addresses these gaps in current technical capabilities in a collaborative nature amongst the core technical laboratories, driven by projected and realized out-year demand. Three capability areas core to microelectronics analysis and verification will be improved: • Physical verification, i.e., destructive analysis of integrated circuits and printed circuit boards • Functional analysis, i.e., non-destructive screening/verification of select, critical parts • Design verification, i.e., verification/assurance of designs, IP, netlists, bitstreams, firmware, etc. These improvements will address two primary attributes: (1) technical capability: laboratory equipment, analysis tools, such as imaging software, and highly skilled tradecraft, and (2) the capacity to perform assessments. This project also develops standards/practices in support of trustworthy designs and supply chains.

Document Details

• Document Type: Project
• Publication Date: Oct 01, 2017
• Source ID: P838_0605140D8Z_5_0400_PB_2017

Tags

Fields of Study

• Computer science

Readers

• Cybersecurity.
• Defense Technology Research and Development.
• Integrated Circuit Design and Technology.

Technology Areas

• Microelectronics