Large-Area Optical Surface Profilometry for Advanced Manufacturing and Materials Processing
Abstract
The proposed request seeks to acquire a high-resolution, non-contact optical profilometer system for fundamental studies of surface generation, material flow and deformation in advanced metals processing and manufacturing. The acquisition will enable the three dimensional (3-D) topography of surfaces to be mapped with nanometer vertical resolution, over a large field of view, ranging from 4 0 µm X 4 0 µm at the lower end to 16 mm X 16 mm at the higher end. Additionally, by stitching together multiple scans, this topography analysis can be extended to cover areas in excess of 100 mm by 100 mm. The system will provide wide ranging capability for studying surface profile parameters, displacements, and defects at the meso/micro scales. It will complement unique imaging capabilities developed in our group for in situ study of large strain deformation, flow and temperature fields, at high spatial and temporal resolution. When the topography measurements enabled by the optical profilometer are integrated with the in situ deformation measurements in the appropriate framework, improved understanding will be gained of phenomena pertaining to flow, microstructure, material removal, and energy dissipation in deformation processing, surface generation processes, and sliding interfaces. This is expected to have transformative impacts on the DoD materials processing and manufacturing sectors. Furthermore, having a direct, topographical description of the surface in conjunction with in situ records of the flow will provide clues to the physical processes taking place, and be advantageous in Òshowing what is and what isnÕt happening.Ó
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Oct 16, 2018
- Source ID
- W911NF1710201
Entities
People
- Srinivasan Chandrasekar
Organizations
- Army Contracting Command
- United States Army
- University of Virginia