Instrumentation for Temperature-Dependent Impedance Measurement of Broadband Devices and Circuits
Abstract
This project will establish a new state-of-the-art system for broadband (20 Hz-70 GHz) on-wafer impedance characterization with integral variable temperature and high voltage biasing capability. The ability to carry out impedance and network analysis simultaneously over a wide range of frequencies, temperatures, and DC bias levels make the proposed system unique relative to existing capabilities. The proposed instrumentation will greatly enhance the measurement capabilities at UCSB and enable crucial advances in many ongoing DoD-funded research projects, including specifically two ARO-sponsored projects in the area of tunable RF devices using MBE-grown complex oxides, and the investigation of Dirac semimetals using MBE-grown cadmium arsenide. The proposed system will be constructed from a number of commercial off-the-shelf instrument, combined with some existing equipment already in place at UC Santa Barbara
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Oct 24, 2018
- Source ID
- W911NF1710239
Entities
People
- Robert York
Organizations
- Army Contracting Command
- United States Army
- University of California, Santa Barbara