Integrated Characterization of Electronic Devices and Materials for Research and Education

Abstract

We propose acquisition of sophisticated, state-of-the-art instrumentation for integrated characterization of electronic devices and materials. The requested instrument is capable of best-of-industry measurements of the DC current-voltage (IV), pulsed IV, high-power IV, and both AC and quasi-static capacitance-voltage applicable to a wide range of devices and materials. The acquisition will augment existing capabilities to support current and future initiatives in device and materials research at Texas State University, a Hispanic serving institution (HSI). The acquisition will be a major addition to our fee-based Analysis Research Service Center to ensure broad access to on- and off-campus projects. It will complement our extensive materials growth and device fabrication RSCs for conducting research supported by federal, state, and industrial funding. The new instrumentation will replace an antiquated failing station to provide new capabilities and reduced measurement time for expanding usership in research and education.

Document Details

Document Type
DoD Grant Award
Publication Date
Sep 11, 2018
Source ID
W911NF1710372

Entities

People

  • M. Holtz

Organizations

  • Army Contracting Command
  • Office of the Secretary of Defense
  • Texas State University

Tags

Readers

  • Defense Acquisition Program Management
  • Research Science/Academic Research
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics