Chemical and Electrical Properties Mapping by Nano FT-IR
Abstract
The acquisition of the proposed instrument, nanoIR2-s, at Delaware State University, will significantly improve the research capabilities of the PI and University in the nanoscale materials characterization. Combining Atomic Force Microscopy (AFM) with infrared spectroscopy (IR) in a high-performance equipment, the nanoIR2-s performs unique materials characterization capability at the nanoscale. Nanoscale infrared spectroscopy is critical to develop bulk nanostructured materials from nanoprecursors as it enables tracking of changes in film composition and nanostructure during various stages of film treatment. The instrument will enable several other research programs ongoing in the College of Mathematics, Natural Sciences and Technology at DSU. NanoIR2-s will facilitate the integration of STEM education initiatives with research in two directions. First, the instrument will be integrated in several courses related to chemistry, physics, geoscience and materials science, allowing hands-on experience of undergraduate and graduate students to state-of-the art characterization techniques, which will enhance job placement options. Second, undergraduate DSU students and high school students at the Early College High School at DSU (EHCS@DSU) who are participating in materials science summer internships in the College of Mathematics, Natural Sciences and Technology, will have access of the instrument as part of their research, providing grounds for recruitment and retention of these students in STEM disciplines.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Sep 11, 2018
- Source ID
- W911NF1710376
Entities
People
- Daniela R Radu
Organizations
- Army Contracting Command
- Delaware State University
- Office of the Secretary of Defense