Broadband light source and detector to study optical modulation properties of exciton-polaritons in two-dimensional materials by real and Fourier space microscopy
Abstract
We plan to upgrade our optical microscopy system with state-of-the art capabilities to measure with very high sensitivity the polaritonic properties of two-dimensional materials coupled to optical cavities and then study their modulation properties under the application of externally applied electric fields. This requires a tunable, broadband optical source which is easy to integrate and operate with complex real and fourier space microscopy set up in the Agarwal laboratory at Penn. Also, since the number of photons emitted from monolayers of 2D materials is very low, a very sensitive detector is required, which has a very high quantum yield of detection to enable very precise measurements in real and fourier space to understand the spectral and dispersion properties of 2D polaritons. The excitonic resonances need to be excited with <1 nm bandwidth laser lines, so a broadband and tunable laser source is required to be able to perform such a task over a large spectral range in a variety of 2D systems. Such a system will also enable measurements in Òreal timeÓ to study the changes in spectral and dispersion properties of 2D polaritons as external fields are applied for applications in electro-optic modulators. This work will significantly enhance our research, training and teaching program currently supported by Dr. Michael GerholdÕs program at the ARO.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Feb 14, 2019
- Source ID
- W911NF1810192
Entities
People
- Ritesh Agarwal
Organizations
- Army Contracting Command
- United States Army
- University of Pennsylvania