Lab-based hard x-ray photoelectron spectrometer and diffractometer for probing depth-resolved electronic structure of quantum materials and interfaces
Abstract
Hard x-ray photoemission employing multi-keV x-rays as the excitation source has recently emerged as a powerful tool for the direct measurement of electronic structure. Its ability to probe deeply into any condensed matter system leads to an enormous range of applications from complex bulk materials to multilayer nanostructures to in-operando device prototypes. To date, comprehensive hard x-ray photoemission investigations of such systems have only been feasible at large-scale national synchrotron facilities. To address this issue, we have recently designed, constructed and tested the first high-flux high-resolution monochromated 5.4 keV microfocus x-ray source for comprehensive laboratory-based hard x-ray photoemission investigations of condensed-matter systems. This x-ray source has been successfully integrated into a versatile system allowing for the full range of angle-resolved investigations of solids and interfaces, including core-level and valence-band spectroscopies, Fermi-surface mapping, standing-wave excitation, and element-specific x-ray photoelectron diffraction. In-operando capabilities have also been implemented for measurements on active devices. This DURIP seeks to complete the construction of the abovementioned system with the purchase and installation of a wide-acceptance-angle photoelectron analyzer (Scienta EW4000). The resulting system will be the first laboratory-based hard x-ray photoemission instrument in the US and will have an immediate impact on the research and educational programs at Temple University, fostering both innovative applications and new collaborations.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- May 13, 2019
- Source ID
- W911NF1810251
Entities
People
- A. X. Gray
Organizations
- Army Contracting Command
- Temple University
- United States Army