Programmable, Transmission Line Based High-Power Single-Shot Pulse Generator for ESD and EMI Characterization of Microelectronic Systems and Devices
Abstract
Organizations within the Department of Defense, such as the Air Force and the Army, are end-users of microelectronic systems, ranging from cellular phones to avionic subassemblies. Electrical pulses, resulting from electrostatic discharge (ESD) or electromagnetic interference (EMI), pose a reliability hazard to those systems. The system components most susceptible to damage are the high-performance integrated circuits (IC). ESD and EMI testing are performed to verify the robustness of a microelectronic system. If an electronic system fails ESD or EMI qualification testing, it must be redesigned, which has costs in terms of both time and money. Rather than effecting design changes through a process of trial and error, it is highly preferable to use simulation to evaluate potential design modifications. However, system-level ESD simulation requires that there be available models of the system components, such as the ICs. The models are derived and calibrated based on measurement data. A transmission line pulse (TLP) generator is the primary instrument used for the measurements. A TLP generator can produce single-shot pulses with rise-time as short as 100 picoseconds, pulse-widths ranging from 1 nanosecond to several hundred nanoseconds, and the output current can be as large as tens of Amperes. This proposal requests funds for the purchase of a TLP tester. A High Power Pulse Instruments 3010C/3011C pulse generator is requested. The pulse rise-time can be varied from 0.1 ns to 50 ns; a clean pulse is provided even at the shortest risetimes. The pulse-width can be varied from 1 ns to 1600 ns and its amplitude can be set as high as 30 A. The device-under-test will usually not be matched to the TLP generatorÕs output impedance; however, the instrument was designed such that reflected pulses do not appear at the device-under-test. Furthermore, software is provided to filter the measurement data to account for the frequency response of the voltage probes and oscilloscope that are used for waveform capture. The TLP generator can be configured to produce pulse shapes other than square. This will allow the researchers to verify that their models can correctly predict the response of the device-under-test to something other than a square pulse, i.e. to arbitrary waveforms. MIL-STD-461G specifies a procedure for EMI qualification testing. The standard includes Test Method CS118, Personnel Borne Electrostatic Discharge. The test methodology and equipment are based on IEC 61000-4-2, which is used for non-military applications. The principal investigator has an IEC 61000-4-2 system-level ESD test-bed in her laboratory. A system-level ESD simulation capability will be demonstrated as follows. Representative electronic equipment (systems) will be selected. Components of each system will be modeled with the aid of measurement data obtained using the new TLP generator. Circuit simulation of the systemÕs response will used to predict its ESD failure level and the failing component. Subsequently, the electronic equipment (system) will be subjected to IEC 61000-4-2 ESD testing. If the measurement and simulation results are in agreement, then the predictive capability of system-level ESD simulation has been established. Circuit simulation of system-level ESD is a fairly new concept and the models constructed thus far have been quite simple, e.g., a one-port piecewise linear model. In this work, the researchers are using machine learning methods and algorithms to derive ESD models of components from measurement data. This approach produces models of greater complexity and accuracy than do previous approaches, provided that adequate training data are available. The requested instrument will provide suitable data.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Feb 14, 2019
- Source ID
- W911NF1810257
Entities
People
- Elyse Rosenbaum
Organizations
- Army Contracting Command
- United States Army
- University of Illinois Urbana–Champaign