An Automated Integrated Optoelectronics Device Test System
Abstract
Integrated photonic device and sub-system probing requires careful alignment of the waveguide or grating coupler to interface with chip-external interrogation systems such as laser, OSA, photodetector, BERT, etc. This project will enhance an automated probe station for testing integrated photonic chips. The benefits of automated testing are (i) time saving, (ii) higher data-accuracy, and (iii) ability to probe complex device-under-test (DUT) via the use of fiber-arrays. The requested system includes a 6-axis fiber alignment stage for both vertical and side chip coupling, a motorized single die stage with thermal tuning and vacuum ports, an overhead and a side alignment camera with a zoom lens, control box, a 4-channel fiber array, a magnetic steel platen, and control software. The research projects supported with this automatic probe system are multifold but focus on nanophotonic optoelectronics device test but also photonic information processing circuits that are currently funded by DOD. These include an attojoule electrooptic modulators (EOM) based-on 2D materials, EOMs based on carbon-materials such as graphene in plasmonic waveguides, photonic routers based on 2x2 switches and photonic interconnects. Future projects supported may include optical FFTs on-chip, hybrid-photon-plasmon interconnects, neuromorphic optical information processing, or RF-photonics such as optical deinterleaving and convolutional neural network filters for sensor fusion supporting network-centered-warfare through significant process enhancement of next generation battlefield-management-systems (BMS).
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Mar 18, 2019
- Source ID
- W911NF1910147
Entities
People
- Volker Sorger
Organizations
- Army Contracting Command
- George Washington University
- United States Army