Aberration Corrected Scanning Transmission Electron Microscope at the University of California, Santa Barbara
Abstract
During the past decade, development of new materials for defense applications at the University of California, Santa Barbara (UCSB) has continued to grow at a rapid pace. These projects require structural and chemical information that go beyond the capabilities of the existing facilities for transmission electron microscopy (TEM) at UCSB. They include the need for obtaining threedimensional information about the local structure of point defects, low-dose imaging with atomic resolution of low-dimensional materials, detection of light elements, the characterization of quantum materials at low temperatures, and further advancement of scanning transmission electron microscopy (STEM) techniques. These needs could be met by the proposed acquisition of a stateof- the art field emission TEM/STEM with aberration correction (probe corrector). This instrument will not only dramatically improve the spatial resolution, but also, in combination with newly developed detectors, allow for new modes of imaging and spectroscopy, dramatically advancing the information that can be obtained from STEM images. The proposed instrument will be located in the Microscopy and Microanalysis Facility at UCSB. It will be available on an open basis to all members of the University and surrounding community, which includes the local defense industry, ensuring access to the instrument in a wide range of defense-related research projects. Graduate students and post-doctoral researchers will be the primary Ôhands-onÕ users of the new instrument. Formal training of the users will be provided in a series of courses offered by the Materials Department at UCSB.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Aug 31, 2020
- Source ID
- W911NF2010326
Entities
People
- Susanne Stemmer
Organizations
- Army Contracting Command
- United States Army
- University of California, Santa Barbara