High Spatial and Angular Resolution X-Ray Diffractometer for Quantum Material Thin Films and Multilayers
Abstract
Quantum materials composed of antiferromagnetic thin films, heterostructures, and multilayers composed of two-dimensional materials are of much current interest because of their possible applications in low power spintronics, THz electronics, and quantum computing. When such materials are synthesized, it is crucial to thoroughly characterize them so that of intrinsic properties (e.g., the electronic and topological properties of the material) or extrinsic properties (i.e., defects). Moreover, if the structural characteristics at the nanoscale can be systematically studied and correlated with the synthesis methodology, the methodology can be altered to optimize the quality of the material. The proposed instrument will consist of a high power, rotating anode x-ray diffractometer optimized to determine the structure of the thin films, heterostructures, and multilayers. In particular, the system will have excellent angular and lateral spatial resolution with high x-ray intensity, characteristics which are crucial for the characterization of ultra-thin films (films thinner than approximately 2 nm). For antiferromagnetic thin films which could be used in THz spintronics, the crystalline quality, interface roughness, and strain can significantly affect their magnonic properties. The system will allow rapid characterization of the structure of the films, both in- and out-of-plane, to identify the structural factors which optimize the filmsÕ spintronic properties. For two-dimensional materials, where samples consist of flakes which are on the order of 100 µm in lateral size, the focused beam (approximately 50 µm in diameter) capabilities of the system will allow the measurement of single flakes, allowing the determination of their structure (for example, the type of stacking in multilayered samples). The combination of high intensity and high lateral resolution will approach the capabilities of synchrotron-based measurements, making high quality routine characterization of our samples in our lab, thus increasing sample quality and reproducibility. Researchers other than the PI and Co-PI at UC Santa Cruz who synthesize thin films and are interested in neuromorphic computing and optical sensors will also benefit from this new instrumentation. From an educational point of view, the instrument will help train a new diverse generation of scientists in the fields of physics, chemistry, and engineering. UC Santa Cruz students at the undergraduate and graduate levels will be trained to use the instrument through collaborations of their advisors with the PI and Co-PI. Undergraduate students from community colleges in California will use the instrument as part of an NSF Research Experiences for Undergraduates (REU) program led by the PI. High school students participating in the summer Science Internship Program (SIP) at UC Santa Cruz, will use the instrumentation as part of their research activities. The PI will give presentations at minority-serving high schools in Northern California which will include remotely controlling the instrument to generate data live during the talk to illustrate basic concepts of interference and crystal structure.
Document Details
- Document Type
- DoD Grant Award
- Publication Date
- Aug 02, 2022
- Source ID
- W911NF2210197
Entities
People
- David Lederman
Organizations
- Army Contracting Command
- Office of the Secretary of Defense
- University of California, Santa Cruz