Advanced X-Ray Integrated Sources (AXIS)
Abstract
The objective of the Advanced X-Ray Integrated Sources (AXIS) program is to greatly reduce the size, weight and power of X-ray sources while dramatically increasing their electrical efficiency through application of microscale engineering technologies such as MEMS and NEMS. Such imaging modalities should speed reverse engineering of integrated circuits to validate trustworthiness as well as contrast-free battlefield imaging of blood vessel injuries in blunt trauma. The Advanced Research component of this effort will focus on applying basic research discoveries to the development of compact, pulsed X-ray sources. Such sources are a necessary component to enable future technologies with high-speed motion imaging capabilities and the reverse engineering of integrated circuits. This program has basic research efforts funded in PE 0601101E, Project ES-01.
Document Details
- Document Type
- Accomplishment
- Publication Date
- Oct 01, 2012
- Source ID
- f2f791c4b8afde5f2167196feb07bf17
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- Root: ELECTRONICS TECHNOLOGY