Reflection and Transmission of Microwaves by Thin Metal Films
Abstract
The reflection and transmission coefficients of metal films are functions of film thickness. An investigation is carried out to determine (a) whether a measurement of the coefficients at microwave frequencies can be expected to yield accurate values of the thickness; (b) whether films of known thickness can be useful as waveguide components. The analysis shows that at thicknesses greater than approx. 10A,for metal films on glass substrates, the reflection coefficient is not a sufficiently sensitive thickness indicator, and the transmission coefficient is too small to permit accurate measurements. At thicknesses less than 10A the electrical parameters are unknown, and such small dimensions are not accurately reproducible.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 30, 1956
- Accession Number
- AD0106025
Entities
People
- Vernon Crawford
Organizations
- Georgia Tech