RESEARCH IN TRACE EMISSION SPECTROSCOPY

Abstract

Information obtained from this research has (a) resulted in a reliable analytical method for the determination of trace impurities in gallium arsenide, (b) extended the understanding of the influence of matrix volatility so that techniques can be varied to suit the matrix volatilization behavior, (c) clarified the problem of the preparation of representative standards, and (d) by the combination of emission spectroscopy, mass spectroscopy and wet chemical analyses pointed the way to maximum effectiveness in the solution of ultratrace analytical problems.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Feb 28, 1962
Accession Number
AD0273969

Entities

People

  • Richard L. Rupp

Organizations

  • Air Force Cambridge Research Laboratories

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Band Structures
  • Chemical Analysis
  • Chemical Synthesis
  • Chemistry
  • Controlled Atmospheres
  • Electronics
  • Electronics Industry
  • Electronics Laboratories
  • Emission Spectroscopy
  • Materials
  • Particle Size
  • Silicon Carbide
  • Spectra
  • Spectrography
  • Spectrometry
  • Spectroscopy

Readers

  • Analytical Chemistry
  • Semiconductor Device Technology
  • Theoretical Analysis.

Technology Areas

  • Microelectronics