TRANSMITTANCE MEASUREMENTS OF OPTICAL MATERIALS AS AFFECTED BY WEDGE ANGLE AND REFRACTIVE INDEX IN THE 2- TO 15-MICRON RANGE

Abstract

Error in the measurement of transmittance can be made with samples having nonparallel faces. This has been investigated because of the extensive use of transmittance as a tool for determining properties of semitransparent mate rials. Specimens of fused quartz, arsenic tri- sulfide, silicon, and germanium, representing a range of refractive indices, were fabricated to provide 0-, 1-, 2-, 5-, and 10-milliradian wedges across 1-inch diameter disks. Trans mittance measurements were taken in the 2- to 15-micron range with Perkin-Elmer Models 21 and 221 spectrophotometers, and at 2 microns with a Cary Model 14 spectrophotometer, and correlated with refractive index and wedge angle. For materials with a low refractive index, such as fused quartz, the error introduced even by the 10-mil wedge was negligible. However, for high index materials, such as germanium, as much as 60% error was introduced by the 10-mil wedge.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1963
Accession Number
AD0403988

Entities

People

  • A. L. Olsen
  • K. B. Labaw
  • L. W. Nichols

Organizations

  • Naval Air Weapons Station China Lake

Tags

Communities of Interest

  • Advanced Electronics
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Band Structures
  • Crystal Structure
  • Indium Antimonides
  • Jet Propulsion
  • Materials
  • Measurement
  • Optical Materials
  • Optical Properties
  • Optics
  • Ordnance Laboratories
  • Orientation (Direction)
  • Physical Properties
  • Refractive Index
  • Silica Glass
  • Single Crystals
  • Transmittance

Fields of Study

  • Physics

Readers

  • Analytical Chemistry
  • Electromagnetic Wave Scattering and Antenna Radiation Engineering
  • Optical Physics and Photonics.