TRANSMITTANCE MEASUREMENTS OF OPTICAL MATERIALS AS AFFECTED BY WEDGE ANGLE AND REFRACTIVE INDEX IN THE 2- TO 15-MICRON RANGE
Abstract
Error in the measurement of transmittance can be made with samples having nonparallel faces. This has been investigated because of the extensive use of transmittance as a tool for determining properties of semitransparent mate rials. Specimens of fused quartz, arsenic tri- sulfide, silicon, and germanium, representing a range of refractive indices, were fabricated to provide 0-, 1-, 2-, 5-, and 10-milliradian wedges across 1-inch diameter disks. Trans mittance measurements were taken in the 2- to 15-micron range with Perkin-Elmer Models 21 and 221 spectrophotometers, and at 2 microns with a Cary Model 14 spectrophotometer, and correlated with refractive index and wedge angle. For materials with a low refractive index, such as fused quartz, the error introduced even by the 10-mil wedge was negligible. However, for high index materials, such as germanium, as much as 60% error was introduced by the 10-mil wedge.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1963
- Accession Number
- AD0403988
Entities
People
- A. L. Olsen
- K. B. Labaw
- L. W. Nichols
Organizations
- Naval Air Weapons Station China Lake