PEM FOR TRANSISTOR MANUFACTURING PROCESS IMPROVEMENT
Abstract
Data is submitted on the operating and storage life tests and environmental tests performed on two groups of pilot line transistors. The failure rates demonstrated by the tests are higher than the specified goal. The test results are not consistent with evaluation of units of the same type fabricated in the factory, or of units manufactured earlier on the pilot line. Failed units are being analyzed to define the failure mechanisms. Installation of the hot sealing oven in a factory drybox is complete and units are being processed through it for accumulation of 2500 units for evaluation. The helium leak test equipment is in the process of being installed in the factory line area. While awaiting completion of the installation, units are being helium leak tested on existing laboratory equipment. The Reliability and Quality Control Department is sampling the production line output to qualify the device for general sale. Additional work is reported in connection with production line process control inspections. Further work on thermal resistance determination is described. The work centered on the d-c Beta method. Procedures of the method are described and its advantages and anticipated usefulness are indicated. Production line transistor failure rates continue to have a close fit with the proposed acceleration curve.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1963
- Accession Number
- AD0414540
Entities
People
- J. Sanders