X-RAY ANALYSIS OF TITANIUM COATINGS AND FILMS
Abstract
Geiger counter and x-ray film techniques were used to study the crystalline structures of thin titanium films and coatings formed by vacuum deposition. An x-ray analysis of the various titanium films, was used to determine the effects of temperature and base metal orientation upon the structures of the deposited films. Results indicate that the degree of preferred orientation of the films can be altered by variations in the vacuum deposition technique. Attempts were made to correlate film orientation with adhesion and corrosion resistance properties.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 16, 1964
- Accession Number
- AD0444349
Entities
People
- Gregory Arutunian
Organizations
- United States Army Tank Automotive Research, Development and Engineering Center