SEQUENTIAL MEASUREMENT OF MULTIDIMENSIONAL TRANSDUCERS
Abstract
A sequential algorithm suggested by R. M. Fano, Massachusetts Institute of Technology, is analyzed and its application to measurement problems is described. From the analysis, bounds to the average number of computations needed to estimate one parameter are obtained, and also a bound to the probability of estimating at least one parameter of a set incorrectly. When an attempt is made to differentiate between parameter values that produce too small an effect on the output, relative to the noise, the sequential method will fail. This difficulty determines a limit to the precision obtainable with the sequential method. A series of simulation experiments was performed to test the hypotheses and results of the theory. These experiments consisted of estimating the characteristic impedance values of the sections of a transmission line constructed of many short segments. Although the theoretical and simulated measurement problems were not identical, the theoretical and experimental results agree, at least qualitatively. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 29, 1964
- Accession Number
- AD0615515
Entities
People
- J. R. Sklar
Organizations
- Massachusetts Institute of Technology