AN ELECTRONIC SYSTEM FOR MEASURING THE ELECTRICAL CHARACTERISTICS OF NONLINEAR DEVICES

Abstract

An electronic system for obtaining the electrical characteristics of non-linear devices is described. Three modes of operation provide the I-V curve of the sample and either the differential conductance or resistance as a function of sample bias. A simple feedback system is shown to be particularly advantageous for determining the conductance of low impedance devices. A theoretical analysis provides an algorithm for separating the resistive and reactive components of the sample admittance and gives criteria for conditions of optimum stability and minimum noise. Finally the measured characteristics of a number of devices are shown to illustrate the capability of the instrument.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1968
Accession Number
AD0674853

Entities

People

  • Michael Kühn
  • W. R. Patterson

Organizations

  • Brown University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Attenuation
  • Attenuators
  • Closed Loop Systems
  • Detection
  • Diodes
  • Dynamic Range
  • Filtration
  • Gain
  • Modules (Electronics)
  • Operational Amplifiers
  • P-N Junctions
  • Power
  • Power Supplies
  • Semiconductors
  • Stability Conditions
  • Transfer Functions
  • Tunnel Diodes

Fields of Study

  • Physics

Readers

  • Approximation Theory.
  • Microwave Engineering.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics