A CENTER OF COMPETENCE IN SOLID STATE MATERIALS AND DEVICES
Abstract
The content of this report, for the second semi-annual period of contract support, comprises three main topics. The first treats of the relationships borne in glasses between microstructure and electrical properties. The second main topic deals with the measurement of parameters of material structure, demonstrating the measurement techniques by applying them to various materials: glass ceramics, nickel alloys, magnetic films, and degenerate semiconductors. The third main topic concerns semiconductors and semiconductor devices. One study reports, for degenerate n-type germanium and silicon, the theoretical variation of the density of quantum states as a function of impurity concentration. In another, the conventional theory of pn junctions is extended by removing the assumption of nondegeneracy. Finally, for both devices and bulk material, the sources of noise are subjected to theoretical and experimental study.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 10, 1968
- Accession Number
- AD0678170
Entities
People
- Arthur J. Brodersen
- Eugene R. Chenette
- Fred A. Lindholm
- Larry L. Hench
- Robert W. Gould
Organizations
- University of Florida