DIGITAL DIAGNOSTIC TECHNIQUES: SURVEY AND RECOMMENDATIONS

Abstract

Finding efficient testing procedures for digital machines has become of prime concern to the industry due to high circuit densities brought about by evolution in semiconductor device technology. The number of inputs required for testing can be reduced from the set of all possible input combinations to a smaller group derived from a dictionary of tests which defines unique relationships between failure mode and output response. Reduction of the test dictionary by prime-implicant minimization methods and by serial application of the reduced set can lead to manageable test programs. These involve sequence lengths characterized by a lower limit, bounded by the logarithm of the number of initial table entries.

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Document Details

Document Type
Technical Report
Publication Date
Oct 02, 1969
Accession Number
AD0696934

Entities

People

  • William R. Smith

Organizations

  • United States Naval Research Laboratory

Tags

Communities of Interest

  • Energy and Power Technologies
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Algorithms
  • Circuits
  • Computer Programming
  • Computer Simulations
  • Computers
  • Consistency
  • Control Simulators
  • Demographic Cohorts
  • Failure Mode And Effect Analysis
  • Generators
  • Literature
  • Networks
  • Sensitivity
  • Simulations
  • Simulators
  • Terminals
  • Test Methods

Readers

  • Computer Programming and Software Development.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems