FAILURE MECHANISMS IN THIN-FILM RESISTORS

Abstract

Thin film cermet resistors on glass substrates were tested and analyzed to determine effects of various termination structures and lead connection methods. The effect of a protective coating for the terminations was also studied. Two test groups were used to provide failure data. Test time for the first group was 1500 hours at 125 C; the second group had test times of 480 hours at 150 C. and 670 hours at 175 C.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1966
Accession Number
AD0707067

Entities

People

  • H. W. Thompson Jr.
  • R. F. Bennett

Organizations

  • Purdue University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Control Panels
  • Control Systems
  • Electrical Engineering
  • Electron Beams
  • Failure Mode And Effect Analysis
  • Film Resistors
  • Films
  • High Temperature
  • Low Temperature
  • Materials
  • Materials Laboratories
  • Measurement
  • Plastic Explosives
  • Resistance
  • Statistical Analysis
  • Thin Film Resistors
  • Thin Films

Readers

  • Mathematics or Statistics
  • Systems Analysis and Design
  • Thin Film Deposition Science.