Fault Isolation Using Frequency Response Techniques
Abstract
An investigation of using the response of a circuit at selected test frequencies to isolate faulty circuit components is made. A procedure using a sensitivity approach for intelligent selection of test frequencies is developed. The developed procedure is tested and the results are compared with results using conventional procedures. The effect of random, within tolerance variations of nonfaulty components on the results is studied for both conventional and developed procedures.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 1970
- Accession Number
- AD0721582
Entities
People
- Charles G. Martinache
Organizations
- Naval Postgraduate School