Effects of High-Energy Ions on Synthetic Quartz

Abstract

Synthetic quartz was bombarded with 3 MeV N(+) ions at doses ranging from 4 x 10 to the 13th power to 2 x 10 to the 16th power N(+)/sq.cm. and was examined by transmission electron microscopy. The nature of the damage in unannealed and annealed specimens was characterized. In particular, it was found that increased Dauphine inversion twinning occurred in specimens receiving doses up to approximately 10 to the 14th power N(+)/sq cm.

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Document Details

Document Type
Technical Report
Publication Date
Nov 20, 1972
Accession Number
AD0753305

Entities

People

  • Charles Bergeron
  • Joseph J. Comer
  • Lester F. Lowe

Organizations

  • Air Force Cambridge Research Laboratories

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Amorphous Materials
  • Crystal Growth
  • Crystallization
  • Crystals
  • Diffraction
  • Electron Beams
  • Electron Diffraction
  • Electron Microscopy
  • Electrons
  • Energy
  • Heating
  • High Energy
  • Materials
  • Microscopy
  • Transition Temperature
  • Transmission Electron Microscopy

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Nuclear and Radiation Engineering.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics