The Structure of Non-Crystalline Materials

Abstract

The primary purpose of this research was to develop the phenomenon of extended x-ray absorption fine structure (EXAFS) as a technique for investigating the structure of non-crystalline materials, particularly amorphous semiconductors. The EXAFS work on amorphous semiconductors was continued on GeSe, GeSe2, As2Se3, As2S3, and As2Te3. Accompanying this final report are three papers describing the EXAFS experimental and data analysis techniques.

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Document Details

Document Type
Technical Report
Publication Date
Dec 31, 1973
Accession Number
AD0774895

Entities

People

  • Farrel W. Lytle

Organizations

  • Boeing

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Absorption
  • Algorithms
  • Amorphous Materials
  • Computer Programs
  • Computers
  • Core Storage
  • Data Analysis
  • Data Processing
  • Diffraction
  • Energy Bands
  • Fast Fourier Transforms
  • Fourier Analysis
  • Measurement
  • Radiation
  • Scattering
  • Spectra
  • X Rays

Fields of Study

  • Physics

Readers

  • Instructional Design and Training Evaluation.
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene