INVESTIGATION OF RELIABILITY TESTING AND PREDICTION TECHNIQUES FOR INTEGRATED CIRCUITS

Abstract

The work is divided into four parts: (1) data analysis and preliminary tests to determine failure mechanisms for early direction in the study; (2) a physics of failure program consisting of fundamental oxide studies, metal contact and interconnection evaluations, and circuit analysis; (3) a test program including data and failure analysis and consisting of two major segments; and (4) the development of a reliability screening procedure for integrated circuits. Three computer programs, SERF, LINDA 1 and LINDA 2 were written to assist in the analysis of data. The physics of failure program consisted of fundamental surface studies to produce stable metal-oxide-silicon (MOS) systems, circuit analysis of the SN5420 integrated circuit, and a study of the molybdenum-gold expanded contact system.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1967
Accession Number
AD0818377

Entities

People

  • D. R. Fewer
  • S. F. Musket
  • W. L. Gill
  • W. L. Workman

Organizations

  • Texas Instruments

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Circuit Analysis
  • Circuits
  • Computer Programs
  • Data Analysis
  • Data Science
  • Electrical Measurement
  • Engineering
  • Failure Mode And Effect Analysis
  • Information Science
  • Integrated Circuits
  • Materials
  • Operating Systems
  • Reliability
  • Semiconductor Devices
  • Semiconductors
  • Test And Evaluation

Fields of Study

  • Engineering

Readers

  • Integrated Circuit Design and Technology.
  • Software Engineering