Research and Development Intrinsic Reliability Subminiature Ceramic Capacitors
Abstract
This report presents an approach toward attaining high life test reliability in subminiature ceramic barium titanate capacitors for transistor circuitry and demonstrates a procedure for selecting capacitors having guaranteed or assured lifetime (ALT) at various voltage and temperature stresses. The report presents the research supporting the plan of voltage selection testing which identifies those capacitors that have an assured useful lifetime (ALT). Other selection plans were surveyed but were rejected. The physics of material failure and reliability is discussed. Two lots of 1200 capacitors (0.01 microfarads and 0.033 microfarads) were voltage tested to identify capacitors which were predicted to fail life testing either prior to ALT or after ALT. Life testing was as long as 25,000 hours at several voltage and temperature conditions. The failure rate, after normalizing data, at 125 C, 25 VDC to ALT (30,300 hours) for the select 0.01 microfarads capacitors was 0. 02% per 1000 hours. The failure rate after normalizing data at 125 C, 25 VDC to ALT (4775 hours) for the select 0.033 microfarads capacitors was 0.086% per 1000 hours. The failure rates to ALT for capacitors predicted to fail prior to ALT exceeded the failure rates of the select capacitors by factors approaching 100.
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 01, 1969
- Accession Number
- AD0864068
Entities
People
- A. R. Vaskas
- T. I. Prokopowicz
Organizations
- Sprague Electric