A Filtering Method to Reveal Crystalline Patterns from Atom Probe Microscopy Desorption Maps

Abstract

A filtering method to reveal the crystallographic information present in Atom Probe Microscopy (APM) data is presented. The method filters atoms based on the time difference between their evaporation and the evaporation of the previous atom. Since this time difference correlates with the location and the local structure of the evaporating atoms on the surface, it can be used to reveal any crystallographic information contained within APM data. The demonstration of this method is illustrated on: A pure Al specimen for which crystallographic poles are clearly visible on the desorption patterns easily indexed. Three Fe-15at. Cr datasets where crystallographic patterns are less obvious and require this filtering method.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Mar 26, 2016
Accession Number
AD1011341

Entities

People

  • Lan Yao

Organizations

  • University of Michigan

Tags

Communities of Interest

  • Air Platforms

DTIC Thesaurus Topics

  • Boundaries
  • Chemistry
  • Crystallography
  • Crystals
  • Data Analysis
  • Desorption
  • Detectors
  • Evaporation
  • Field Ion Microscopy
  • Filtration
  • Grain Boundaries
  • Low Density
  • Materials
  • Materials Science
  • Microscopy
  • Orientation (Direction)
  • United States

Readers

  • Computer Vision.
  • Materials Science and Engineering.