Native Defect Characterization of Single Crystal UO2 Pre- and Post-Neutron Irradiation

Abstract

Single crystal uranium dioxide (UO2) samples were studied using photoluminescence (PL) to characterize the surface defects present following growth. X-ray Fluorescence (XRF) and gamma ray spectroscopy measurements were collected to help identify any impurities present in the sample. PL measurements were made using a Kimmon Koha Co., LTD. IK series helium-cadmium (HeCd) 325 nm laser with an energy range of 5 mW/10 mV, in a 10-6 Torr vacuum, and at 10K. Data was collected through a Products for Research Inc. PHOTOCOOLTM series photomultiplier tube (PMT) attached to a Horiba Scientific Inc. SPEX 1250 M monochromator and analyzed with SynerJYTM.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 2018
Accession Number
AD1056254

Entities

People

  • Steven M. Hoak

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Chemistry
  • Color Centers
  • Crystal Lattices
  • Crystal Structure
  • Crystallography
  • Crystals
  • Gamma Rays
  • Measurement
  • Optical Properties
  • Point Defects
  • Scattering
  • Spectra
  • Spectroscopy
  • Spin-Orbit Interaction
  • Visible Spectra
  • X Rays

Fields of Study

  • Physics

Readers

  • Materials Science and Engineering.
  • Nuclear and Radiation Engineering.
  • Spectroscopy.

Technology Areas

  • Directed Energy