A Focal Plane Array and Electronics Model fro CMOS and CCD Sensors in the AFIT Sensor and Scene Emulation Tool (ASSET)

Abstract

Electro-optical and infrared (EO/IR) sensor models are useful tools that can facilitate understanding a system's behavior without expensive and time-consuming testing of an actual system. EO/IR models are especially important where truth data is required but is sometimes impractical to obtain through experimentation due to expense or difficulties in procuring hardware. This work describes implementation of a focal plane array (FPA) model of CCD and CMOS photodetectors as a component in the AFIT Sensor and Scene Emulation Tool (ASSET). The FPA model covers conversion of photo-generated electrons to voltage and then to digital numbers. It incorporates sense node, source follower, and analog-to-digital converter (ADC) components contributing to gain non-linearities and includes noise sources associated with the detector and electronics such as shot, thermal, 1/f, and quantization noise. This thesis describes the higher fidelity FPA and electronics model recently incorporated into ASSET, and it also details validation of the improved model using EO/IR imager data collected with laboratory measurements. The result is an improved model capable of generating realistic synthetic data representative of a wide range of systems for use in new algorithm development and data exploitation techniques supporting a broad community of academic, commercial, and military researchers.

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Document Details

Document Type
Technical Report
Publication Date
Mar 21, 2019
Accession Number
AD1075051

Entities

People

  • Fernando D Fernandez

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors
  • Weapons Technologies

DTIC Thesaurus Topics

  • Air Force
  • Algorithms
  • Arrays
  • Charge Carriers
  • Charge Coupled Devices
  • Complementary Metal-Oxide Semiconductors
  • Converters
  • Databases
  • Detection
  • Detectors
  • Digital Data
  • Electromagnetic Spectra
  • Electronics
  • Electronics Industry
  • Electronics Laboratories
  • Focal Plane Arrays
  • Focal Planes
  • Materials
  • Measurement
  • Normal Distribution
  • Optics
  • Photodetectors
  • Power Spectra
  • Random Variables
  • Scattering
  • Semiconductor Devices
  • Semiconductors
  • Standards

Readers

  • Computational Modeling and Simulation
  • Image Processing and Computer Vision.
  • Sensor Fusion and Tracking Systems.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems