Gallium Nitride (GAN) RF Challenge; BAE Design Testing
Abstract
The U.S. Department of Defense (DOD) Gallium Nitride (GAN) RF Challenge is enabling development and fabrication of the best concepts for high-performance, efficient, broadband monolithic microwave integrated circuits (MMICs) related to the 5G expansion and to critical electronic warfare needs. The circuits documented in this report represent some of the US Combat Capabilities Development Command Army Research Laboratory designs as part of the DOD Design Team for the BAE Systems 0.18-micrometer GAN multi-project wafer fabrication. When these fabricated designs are returned in 2021, they will be tested, evaluated, and documented in future technical reports.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 2021
- Accession Number
- AD1148108
Entities
People
- Ali Darwish
- John Penn
- Khamsouk Kingkeo
- Sami Hawasli
Organizations
- United States Army