Comparing Thickness Measurement Methods Using Bland-Altman Analysis

Abstract

This report discusses the Bland Altman method of statistical comparison and employs it to compare and contrast two different methods of chemical agent resistant coating (CARC) thickness measurement, implementing this method of statistical comparison for the first time outside the medical sciences context. The same CARC samples were separately measured using a Traceable digital caliper and an Elcometer 456 coating thickness gauge. Measuring CARC thickness accurately is of the utmost importance to accurately determine the dielectric properties of a given CARC sample and consequently use the dielectric responses of CARCs to detect vulnerabilities, weathering, and any inhomogeneity in the deposited coating. Using the Bland Altman method of statistical comparison demonstrates the digital calipers are not interchangeable with the Elcometer when it comes to measuring the thickness of CARC coatings and shows the digital calipers consistently overestimate the thickness by 5.94 m. The viability and effectiveness of the Bland Altman method of statistical comparison outside a medical sciences context are also demonstrated and affirmed.

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Document Details

Document Type
Technical Report
Publication Date
Sep 30, 2021
Accession Number
AD1149580

Entities

People

  • Daniel Pope
  • Daniel Shreiber
  • Lucas Tommervik

Organizations

  • Oak Ridge Associated Universities
  • United States Army

Tags

Communities of Interest

  • Biomedical

DTIC Thesaurus Topics

  • Abstracts
  • Accuracy
  • Agreements
  • Availability
  • Chemical Warfare Agents
  • Classification
  • Coatings
  • Contracts
  • Contrast
  • Dielectric Properties
  • Materials
  • Measurement
  • Military Research
  • Monitoring
  • Normality
  • Precision
  • Refractive Index
  • Sampling
  • Security
  • Spectroscopy
  • Standards
  • Statistical Analysis
  • Test And Evaluation
  • Thickness
  • Time Domain
  • Viability
  • Vulnerability

Readers

  • Educational Psychology
  • Systems Analysis and Design
  • Thin Film Deposition Science.