Optical/Infrared Microscopy and Spectroscopy System for the Characterization of Point Defects and Carrier Dynamics in 2D and 3D Semiconductors

Abstract

Major Goals: The main goal in this project was to augment the research capabilities at CCNY through the acquisition of three complementary items, namely, a super-continuum laser, a superconducting infra-red (IR) photodetector, and a streak camera. The plan was to incorporate these instruments into existing optical microscopes and/or to develop supporting systems that would allow their use.

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Document Details

Document Type
Technical Report
Publication Date
Jun 09, 2021
Accession Number
AD1187777

Entities

People

  • Carlos Meriles
  • Vinod Menon

Organizations

  • City College of New York

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Abstracts
  • Cameras
  • Detectors
  • Dynamics
  • Images
  • Information Operations
  • Laser Beams
  • Lasers
  • Magnetic Resonance
  • Microscopes
  • Microscopy
  • Military Research
  • New York
  • Optical Fibers
  • Photographs
  • Photonics
  • Point Defects
  • Semiconductors
  • Streak Cameras
  • Students
  • Technology Transfer

Fields of Study

  • Physics

Readers

  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Research Science/Academic Research
  • Sensor Fusion and Tracking Systems.

Technology Areas

  • Directed Energy
  • Microelectronics