Study of N Incorporation in InSb on GaAs by Molecular Beam Epitaxy for Long Wavelength

Abstract

The distinguishing features of dilute nitride III-V semiconductors lie in the large simultaneous reduction in the bandgap and lattice parameter when N is incorporated in small amounts in an otherwise wide band gap III-V material. In particular, N incorporation in InSb is attracting great attention due to its potential applications in the long wavelength infrared (LWIR) applications. However, the relatively small atomic size of N with respect to Sb makes the growth of good quality InSbN layers challenging with effective N incorporation. In this dissertation we present a correlation of the molecular beam epitaxial growth parameters on the type of N-bonding in the InSbN epilayers.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Sep 20, 2013
Accession Number
AD1194384

Entities

People

  • Nimai Patra
  • Shanthi Iyer

Organizations

  • North Carolina Agricultural and Technical State University

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors

DTIC Thesaurus Topics

  • Analyzers
  • Band Gaps
  • Crystal Growth
  • Crystal Lattices
  • Crystals
  • Detection
  • Detectors
  • Electronics Laboratories
  • Energy Bands
  • Epitaxial Growth
  • Infrared Detectors
  • Material Degradation Processes
  • Optical Properties
  • Optics
  • Power Electronics
  • Quantum Wells
  • Scattering
  • Semiconductors
  • Spectra
  • Three Dimensional
  • Transition Temperature

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology
  • Theoretical Analysis.

Technology Areas

  • Microelectronics