Design and Implementation of a Data Acquisition System with In-Situ Picoammeter for Automated Reliability Testing
Abstract
In recent years, the military has been exploring the use of wide bandgap semiconductors (WBGS) such as gallium nitride (GaN) and silicon carbide (SiC) due to their promising material properties, as compared to silicon (Si). Understanding the reliability of these high-performance WBGS devices is paramount to their implementation in military systems. However, it remains to be tested because good-quality reliability data is needed, but it is difficult and expensive to produce. This thesis looks at the design and implementation of a modular reliability testing subsystem in the form of a novel data acquisition system. First, a system was designed to perform automated, in-situ leakage current measurements of up to four devices under test (DUT)with sub-nA resolution. Next, a wide sample of devices consisting of a resistor, two Zener diodes, a power diode, two GaN diodes, and a field effect transistor (FET) were subjected to various voltage sweep and reverse-bias tests that were recorded by the system. Finally, the results of those validation tests were processed and analyzed. The system achieved leakage current resolutions below 100 pA, demonstrating its ability to measure various devices.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 2023
- Accession Number
- AD1212984
Entities
People
- Richard A. Ramos
Organizations
- Naval Postgraduate School