Noise Limitations of rf SQUIDS.
Abstract
In this paper a discussion is given of the noise sources and sensitivity limits of the rf biased SQUID. Both the low critical current inductive and the higher critical current hysteretic devices are considered. The intrinsic SQUID noise is treated by considering the internal flux response of a SQUID ring to an applied rf flux. While approximate, this approach yields the most direct picture of the nature of the intrinsic noise. Circuit optimization procedures for maximizing SQUID performance under various operating conditions are also outlined. Finally the effects of non-ideal weak link behavior upon SQUID operation are treated. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Oct 05, 1976
- Accession Number
- ADA032722
Entities
People
- Robert A. Buhrman
Organizations
- Cornell University