Development of X-Ray Diagnostics for Advanced Concepts Simulation Facilities.
Abstract
A stacked vacuum x-ray diode has been developed for application to Advanced Concept Simulation Facilities. A three channel diode was designed, built and tested. The three channels have 50 to 70 percent energy resolution with bands centered at approximately 1, 2.25 and 6.6 keV. Alternative channel designs are readily obtainable, as well as a rate diode to provide flat energy response from 1 to 20 keV. A pair of triple diodes would be capable of providing temporal and spectral resolution of the output of low energy simulation facilities in the energy range from 1 to 10 keV.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 08, 1976
- Accession Number
- ADA036561
Entities
People
- J. J. Lepage
- R. B. Moler
- R. I. Miller